
Due to the extremely high requirements for product precision in the semiconductor industry, even minor defects can lead to product performance degradation or failure. Super-depth-of-field microscopes can enhance the efficiency of quality inspection for semiconductor products, ensuring product reliability and reducing the defect rate, thereby enhancing the market competitiveness of the products. At the same time, through precise measurement and data analysis, they provide a scientific basis for optimizing the semiconductor production process.
Observe bonding defects to prevent device failure and reliability issues.
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检查线路缺陷,保障芯片性能与长期可靠性
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